@InProceedings{BarqueteCoraCampTrav:2008:DiFiCh,
               author = "Barquete, D. M. and Corat, Evaldo Jos\é and Campos, R. A. and 
                         Trava-Airoldi, Vladimir Jesus",
          affiliation = "{} and {Instituto Nacional de Pesquisas Espaciais (INPE)} and 
                         {Instituto Nacional de Pesquisas Espaciais (INPE)} and {Instituto 
                         Nacional de Pesquisas Espaciais (INPE)}",
                title = "Diamond Films Chemical Vapor Deposition on Cemented Carbides Using 
                         Vanadium Carbide Interface",
            booktitle = "Anais...",
                 year = "2008",
         organization = "Encontro SBPMat, 7.",
             keywords = "diamond film, CVD, interface, vanadium carbide, thermal 
                         diffusion.",
             abstract = "WC-Co cemented carbide tools are extensively used in high scale 
                         and high technology products, as in automotive and aerospace 
                         industries, chiefly in machining operations of aluminum parts. 
                         Recently, WC micrograin was developed to increase tool life and 
                         cutting performance. Diamond chemical vapor deposition (CVD) films 
                         is an important process to boost micrograin cemented carbide tools 
                         performance, however its contribution is still limited, due to 
                         unfavorable effects of the cobalt binder and thermal expansion 
                         mismatch. Several solutions to this problem have been proposed and 
                         implemented, but up to now they are not effective to achieve 
                         industrial extensive acceptance. In this work, a thermal reactive 
                         and diffused interface layer of vanadium carbide (VC) has been 
                         applied to improve film quality, adherence of diamond film to 
                         substrate and tool life and cutting performance. Figure 1 shows 
                         the interface transverse section and the 9 {\`{\i}}m thick VC 
                         interlayer. Figure 2 shows the Raman spectroscopy of the diamond 
                         film, that evidences its crystallinity and a compressive stress of 
                         1.05 GPa, corresponding to 3 cm-1 peak shift. Characterization of 
                         the film was realized by Raman spectroscopy, X-ray diffraction, 
                         scanning electron microscopy and indentation tests.",
  conference-location = "Guaruj\á, SP",
      conference-year = "28 set. - 02 out.",
             language = "en",
        urlaccessdate = "12 maio 2024"
}